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Beilstein J. Nanotechnol. 2017, 8, 1774–1785, doi:10.3762/bjnano.8.179
Figure 1: Theoretical surface-specific numbers of deposited particles (for quadratic packing) in dependence o...
Figure 2: SEM images of a) spherical Au particles (60 nm) and b) Au rods (25 × 77 nm) prepared on track etchi...
Figure 3: SEM images of a) spherical Au particles (60 nm) and b) Au rods (25 × 77 nm) prepared on Si wafers b...
Figure 4: SEM images of a) spherical Ag particles (50 nm) and b) fractal TiO2 particles (<150 nm) prepared on...
Figure 5: SEM overview image of spherical SiO2 particles (100 nm) prepared on Si waver by conventional drop-d...
Figure 6: SEM images of spherical SiO2 particles (100 nm) prepared on Si wafers by a) conventional drop-dryin...
Figure 7: SEM images of spherical SiO2 particles (100 nm) and b) fractal TiO2 particles (<150 nm) prepared on...
Figure 8: AFM analyses: a) AFM image and b) distribution of measured heights for spherical SiO2 particles (10...